@article{Vrabiy2015causes,
author={Vrabiy, E.. and Alekseev, V.. and Piskun, G.. and Degalevich, D..},
title={Causes of damage to the metallization of integrated circuits in terms of currents of high density},
journal={Actual directions of scientific researches of the XXI century: theory and practice},
publisher={FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov},
year={2015},
pages={228-232},
volume={3},
issue={7},
}