00710naa#a2200205#i#4500001001400000005001700014011001400031100004100045101000800086102000700094200011900101210013700220215001000357608002700367700002000394700002200414700002200436700002500458856002100483EN\\bibl\830520251217022134.3##a2308-8877##a20151210b2015####ek#y0engy0150####ca0#aRUS##aRU1#aCauses of damage to the metallization of integrated circuits in terms of currents of high densityeJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2015##a4 с.##aJournal article2local#1aVrabiygEduard #1aAlekseevgViktor #1aPiskungGennadiy #1aDegalevichgDmitriy 4#aanni.editorum.ru