00710naa#a2200205#i#450# EN\\bibl\8305 20260314012131.6 2308-8877 20151210b2015####ek#y0engy0150####ca RUS RU Causes of damage to the metallization of integrated circuits in terms of currents of high density Journal article Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2015 4 с. Journal article local Vrabiy Eduard Alekseev Viktor Piskun Gennadiy Degalevich Dmitriy anni.editorum.ru