00740naa#a2200205#i#4500001001400000005001700014011001400031100004100045101000800086102000700094200014900101210013700250215001000387608002700397700002500424700002000449700002200469700002200491856002100513EN\\bibl\833420260317171031.2##a2308-8877##a20151210b2015####ek#y0engy0150####ca0#aRUS##aRU1#aThe specific use of methods of non-destructive diagnostics of semiconductor products after exposure to electrostatic dischargeseJournal article1#aVoronezhcFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozovd2015##a4 с.##aJournal article2local#1aDegalevichgDmitriy #1aVrabiygEduard #1aPiskungGennadiy #1aAlekseevgViktor 4#aanni.editorum.ru